This commercial transistor tester circuit (EICO 666) is from a Japanese publication from the 1960s. The switch selects the types of test with the switching of the terminals and the gain ranges.
This “compandor” circuit has the opposite effect of CB15195E. The LS150 is not common today and...
This circuit was obtained from an American documentation from the 1980s. The T1 triggering...
This circuit is suggested by the Linear Applications Handbook of National Semiconductor, being used...